Indian University Technology Database

Optics and Photonics

Simplified Technique for Evaluation of Optical Constants of Thin Films
Ref No:QxWx01/011
Sub Class:
Technology Outcome: Product
Development Status: Business Concept
IPR Status: Not Patented
Technology Description: The product is based on numerical and iterative techniques, which can be used for evaluation of optical constants of opaque, semi-transparent and transparent thin films. The process uses computer software to arrive at accurate values of n & k for thin films in a given range of wavelengths. The application areas are thin film Research on semi- conductors, metals and dielectrics. The competitive advantage is: (i) Cheap and commercially feasible.
Technology owner:
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Source: Thapar Institute of Engineering and Technology (Deemed University)